GENEVA, Feb. 8 -- CARL ZEISS GOM METROLOGY GMBH (Schmitzstrasse 238122 Braunschweig) filed a patent application (PCT/EP2025/071623) for "METHOD FOR THE AUTOMATED IMAGE-BASED DETECTION OF NODES IN A CONTRAST LINE GRID" on Jul 28, 2025. With publication no. WO/2026/027461, the details related to the patent application was published on Feb 05, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): SEREFOGLOU, Stefanos (SchmitzstraBe 238122 Braunschweig)
Abstract: The present invention relates to a method for detecting the surface geometry of an object and in particular changes in the surface geometry...