International Patent: AXIAL FORCE MEASUREMENT DEVICE, AXIAL FORCE MEASUREMENT METHOD, AND AXIAL FORCE MEASUREMENT SYSTEM

GENEVA, July 6 -- HITACHI, LTD. filed a patent application (JP2025/039520) for “AXIAL FORCE MEASUREMENT DEVICE, AXIAL FORCE MEASUREMENT METHOD, AND AXIAL FORCE MEASUREMENT SYSTEM”. With publication no. WO/2026/140559, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01L 5/00

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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