GENEVA, July 18 -- HITACHI HIGH-TECH CORPORATION filed a patent application (JP2025/028507) for “AUTOMATIC ANALYSIS DEVICE, DIAGNOSTIC SYSTEM, AND DIAGNOSTIC METHOD”. With publication no. WO/2026/150614, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G01N 35/00
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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