International Patent: ATOMIC FORCE MICROSCOPE WITH PROBE DISTANCER

GENEVA, June 19 -- NEARFIELD INSTRUMENTS B.V. filed a patent application (NL2025/050575) for “ATOMIC FORCE MICROSCOPE WITH PROBE DISTANCER”. With publication no. WO/2026/106479, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01Q 70/10

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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