GENEVA, Jan. 5 -- ASML NETHERLANDS B.V. (P.O. Box 3245500 AH Veldhoven) filed a patent application (PCT/EP2025/064966) for "METHODS FOR INSPECTING IMAGES" on May 29, 2025. With publication no. WO/2026/002519, the details related to the patent application was published on Jan 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): JIANG, Aiqin (80 W Tasman Dr.San Jose, California 95134), WALLOW, Thomas I. (80 W Tasman Dr.San Jose, California 95134)

Abstract: A method of inspecting an image includes receiving the image, and generating a reference image based on the received image. The method also...