INTERNATIONAL PATENT: ARKRAY, INC., アークレイ株式会社 FILES APPLICATION FOR "DETERMINATION METHOD, SPECIMEN DATA IMPUTATION METHOD, SPECIMEN DATA ESTIMATION METHOD AND DETERMINATION SYSTEM"

GENEVA, May 11 -- ARKRAY, INC. (57, Nishiaketa-cho, Higashikujo, Minami-ku, Kyoto-shi, Kyoto6018045), アークレイ株式会社 (京都府京都市南区東九条西明田町５７番地) filed a patent application (PCT/JP2025/037657) for "DETERMINATION METHOD, SPECIMEN DATA IMPUTATION METHOD, SPECIMEN DATA ESTIMATION METHOD, AND DETERMINATION SYSTEM" on Oct 27, 2025. With publication no. WO/2026/094874, the details related to the patent application was published on May 07, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed...