INTERNATIONAL PATENT: ARKRAY, INC., アークレイ株式会社 FILES APPLICATION FOR "CHARACTERISTIC DETERMINATION METHOD, DEVICE, PROGRAM AND SYSTEM"

GENEVA, Dec. 16 -- ARKRAY, INC. (57, Nishiaketa-cho, Higashikujo, Minami-ku, Kyoto-shi, Kyoto6018045), アークレイ株式会社 (京都府京都市南区東九条西明田町５７番地) filed a patent application (PCT/JP2025/020288) for "CHARACTERISTIC DETERMINATION METHOD, DEVICE, PROGRAM, AND SYSTEM" on Jun 04, 2025. With publication no. WO/2025/254164, the details related to the patent application was published on Dec 11, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organizatio...