INTERNATIONAL PATENT: ARKRAY, INC., アークレイ株式会社 FILES APPLICATION FOR "ABNORMAL SPOTTING DETECTION METHOD, ANALYSIS METHOD, ABNORMAL SPOTTING DETECTION DEVICE AND ANALYSIS DEVICE"

GENEVA, Feb. 10 -- ARKRAY, INC. (57, Nishiaketa-cho, Higashikujo, Minami-ku, Kyoto-shi, Kyoto6018045), アークレイ株式会社 (京都府京都市南区東九条西明田町５７番地) filed a patent application (PCT/JP2025/026864) for "ABNORMAL SPOTTING DETECTION METHOD, ANALYSIS METHOD, ABNORMAL SPOTTING DETECTION DEVICE, AND ANALYSIS DEVICE" on Jul 29, 2025. With publication no. WO/2026/029060, the details related to the patent application was published on Feb 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by...