INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "OPTICAL INSPECTION OF WAFER BEVELS USING MULTIPLE LIGHT SOURCES"

GENEVA, May 12 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2025/049571) for "OPTICAL INSPECTION OF WAFER BEVELS USING MULTIPLE LIGHT SOURCES" on Oct 06, 2025. With publication no. WO/2026/096157, the details related to the patent application was published on May 07, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): WANG, Zhi (3050 Bowers AvenueSanta Clara, California 95054), BHATIA, Sidharth (3050 Bowers AvenueSanta Clara, California 95054), SEAMONS, Martin (3050 Bowers AvenueSanta Clara, California 95054), BALASUBRAMANIAN, Gan...