INTERNATIONAL PATENT: APPLE INC. FILES APPLICATION FOR "LP-WUR MEASUREMENT DESIGN AND LP-SS INTERFERENCE MANAGEMENT"

GENEVA, May 17 -- APPLE INC. (One Apple Park Way, CupertinoCalifornia 95014) filed a patent application (PCT/CN2024/131028) for "LP-WUR MEASUREMENT DESIGN AND LP-SS INTERFERENCE MANAGEMENT" on Nov 08, 2024. With publication no. WO/2026/097486, the details related to the patent application was published on May 15, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BETTANCOURT ORTEGA, Rolando E. (Karlstrasse 77, Munich, 80335 Bavaria-Bayern), TANG, Yang (700 N. Mary Avenue, SunnyvaleCalifornia 94085), WU, Dan (International Finance Centre, 8 Jianguomenwai AvenueChaoyang District, Beijing 100022),...