INTERNATIONAL PATENT: APPLE INC., HE, HONG FILES APPLICATION FOR "MEASUREMENT REPORT AND EVENT EVALUATION FOR UE-INITIATED BEAM REPORTING"

GENEVA, April 13 -- APPLE INC. (One Apple Park WayCupertino, California 95014), HE, Hong (One Apple Park WayCupertino, California 95014) filed a patent application (PCT/CN2024/123212) for "MEASUREMENT REPORT AND EVENT EVALUATION FOR UE-INITIATED BEAM REPORTING" on Oct 03, 2024. With publication no. WO/2026/073414, the details related to the patent application was published on Apr 09, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CUI, Jie (One Apple Park WayCupertino, California 95014), ZENG, Wei (One Apple Park WayCupertino, California 95014), ZHANG, Dawei (One Apple Park WayCupertino, Cal...