INTERNATIONAL PATENT: ALCON INC. FILES APPLICATION FOR "SYSTEMS AND METHODS FOR PROBE DETECTION"

GENEVA, April 6 -- ALCON INC. (Rue Louis-d'Affry 61701 Fribourg) filed a patent application (PCT/IB2025/058701) for "SYSTEMS AND METHODS FOR PROBE DETECTION" on Aug 28, 2025. With publication no. WO/2026/069039, the details related to the patent application was published on Apr 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): JUNG, David (c/o Alcon Research, LLC20511 Lake Forest DriveLake Forest, California 92630), KARIM, John Hossein (c/o Alcon Research, LLC20511 Lake Forest DriveLake Forest, California 92630), GUERRERO, Christopher Andrew (c/o Alcon Research, LLC20511 Lake Forest DriveL...