International Patent: AI-BASED DIAGNOSTIC SYSTEM USING TENDERNESS AND DIAGNOSIS METHOD THEREFOR

GENEVA, Aug. 14 -- UNIVERSITY-INDUSTRY COOPERATION GROUP OF KYUNG HEE UNIVERSITY filed a patent application (KR2026/000535) for “AI-BASED DIAGNOSTIC SYSTEM USING TENDERNESS AND DIAGNOSIS METHOD THEREFOR”. With publication no. WO/2026/168795, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: A61B 5/00

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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