INTERNATIONAL PATENT: ADVANCED MICRO DEVICES, INC. FILES APPLICATION FOR "DRAM ECC CIRCUIT ERROR DETECTION INTEGRITY"

GENEVA, Jan. 6 -- ADVANCED MICRO DEVICES, INC. (2485 Augustine DriveSanta Clara, California 95054) filed a patent application (PCT/US2025/028446) for "DRAM ECC CIRCUIT ERROR DETECTION INTEGRITY" on May 08, 2025. With publication no. WO/2026/005893, the details related to the patent application was published on Jan 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): NYGREN, Aaron John (2485 Augustine DriveSanta Clara, California 95054), SCOTT, Eric M. (2485 Augustine DriveSanta Clara, California 95054)

Abstract: Implementations herein describe a system including a system-on-chip including at...