International Patent: ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION SYSTEM, AND ABNORMALITY DETECTION METHOD

GENEVA, Aug. 31 -- MITSUBISHI ELECTRIC CORPORATION filed a patent application (JP2025/019661) for “ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION SYSTEM, AND ABNORMALITY DETECTION METHOD”. With publication no. WO/2026/176657, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G08B 21/24

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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