GENEVA, Oct. 1 -- ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FÜR HALBLEITERPRÜFTECHNIK MBH filed a patent application (EP2025/079919) for “A CHARGED PARTICLE BEAM DEVICE AND METHOD”. With publication no. WO/2026/189680, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: H01J 37/147
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Disclaimer: Curated by HT Syndication....