INTERNATIONAL PATENT: FUJI ELECTRIC CO., LTD., 富士電機株式会社 FILES APPLICATION FOR "FLUID DISTRIBUTOR AND HEAT PUMP CYCLE APPARATUS"

GENEVA, March 10 -- FUJI ELECTRIC CO., LTD. (1-1, Tanabeshinden, Kawasaki-ku, Kawasaki-shi, Kanagawa2109530), 富士電機株式会社 (神奈川... Read More

INTERNATIONAL PATENT: MITSUBISHI ELECTRIC CORPORATION, 三菱電機株式会社 FILES APPLICATION FOR "POWER INFERENCE DEVICE, POWER CONTROL SYSTEM, SYSTEM STABILIZATION SYSTEM, MODEL GENERATION DEVICE AND POWER INFERENCE METHOD"

GENEVA, March 10 -- MITSUBISHI ELECTRIC CORPORATION (7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo1008310), 三菱電機株式会社 (東京都&#213... Read More

INTERNATIONAL PATENT: JVCKENWOOD CORPORATION, 株式会社ＪＶＣケンウッド FILES APPLICATION FOR "AMPLIFIER CIRCUIT"

GENEVA, March 10 -- JVCKENWOOD CORPORATION (3-12, Moriyacho, Kanagawa-ku, Yokohama-shi Kanagawa2210022), 株式会社ＪＶＣケンウッ&#12489... Read More

INTERNATIONAL PATENT: NTT, INC., ＮＴＴ株式会社 FILES APPLICATION FOR "INFORMATION PROCESSING DEVICE AND PROGRAM"

GENEVA, March 10 -- NTT, INC. (5-1, Otemachi 1-chome, Chiyoda-ku, Tokyo1008116), ＮＴＴ株式会社 (東京都千代田区&#228... Read More

INTERNATIONAL PATENT: FUJI INDUSTRIAL CO., LTD., 富士工業株式会社 FILES APPLICATION FOR "EXHAUST EMISSION CONTROL DEVICE AND EXHAUST EMISSION CONTROL DEVICE SYSTEM"

GENEVA, March 10 -- FUJI INDUSTRIAL CO., LTD. (1-9, Fuchinobe 2-chome, Chuo-ku, Sagamihara-shi, Kanagawa2520206), 富士工業株式会社 (神奈&#24... Read More

INTERNATIONAL PATENT: JFE STEEL CORPORATION, ＪＦＥスチール株式会社 FILES APPLICATION FOR "METAL MATERIAL QUALITY PREDICTION MODEL GENERATING METHOD, METAL MATERIAL QUALITY PREDICTION METHOD, METAL MATERIAL QUALITY INFLUENCING FACTOR ESTIMATION METHOD, METAL MATERIAL MANUFACTURING METHOD, METAL MATERIAL QUALITY PREDICTION MODEL GENERATING DEVICE, METAL MATERIAL QUALITY PREDICTING DEVICE AND METAL MATERIAL QUALITY INFLUENCING FACTOR ESTIMATING DEVICE"

GENEVA, March 10 -- JFE STEEL CORPORATION (2-3, Uchisaiwai-cho 2-chome, Chiyoda-ku, Tokyo1000011), ＪＦＥスチール株式会社 (東&#2... Read More

INTERNATIONAL PATENT: VERICERTS, INC., ＶＥＲＩＣＥＲＴＳ株式会社 FILES APPLICATION FOR "INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD AND INFORMATION PROCESSING PROGRAM"

GENEVA, March 10 -- VERICERTS, INC. (Urbannet Otemachi Building 13F, 2-2-2 Otemachi, Chiyoda-ku, Tokyo1000004), ＶｅｒｉＣｅｒｔｓ株式... Read More

INTERNATIONAL PATENT: MITSUBISHI ELECTRIC CORPORATION, 三菱電機株式会社 FILES APPLICATION FOR "SURROUNDINGS MONITORING DEVICE, MOBILE BODY, SURROUNDINGS MONITORING METHOD AND PROGRAM"

GENEVA, March 10 -- MITSUBISHI ELECTRIC CORPORATION (7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo1008310), 三菱電機株式会社 (東京都&#213... Read More

INTERNATIONAL PATENT: HITACHI, LTD., 株式会社日立製作所 FILES APPLICATION FOR "DESIGN SUPPORT DEVICE, DESIGN SUPPORT SYSTEM AND DESIGN SUPPORT METHOD"

GENEVA, March 10 -- HITACHI, LTD. (6-6, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008280), 株式会社日立製作所 (東京都千&#20195... Read More

INTERNATIONAL PATENT: AIXTAL CORPORATION, アイクリスタル株式会社, NATIONAL UNIVERSITY CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH SYSTEM, 国立大学法人東海国立大学機構, RIKEN, 国立研究開発法人理化学研究所 FILES APPLICATION FOR "INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD AND PROGRAM"

GENEVA, March 10 -- AIXTAL CORPORATION (TOIC, Nagoya University, 1, Furo-cho, Chikusa-ku, Nagoya-shi, Aichi4648601), アイクリスタル株式会&#3... Read More

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