ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,446, issued on April 21, was assigned to GM GLOBAL TECHNOLOGY OPERATIONS LLC (Detroit). "Systems and methods for in-line monitoring of pro... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,447, issued on April 21, was assigned to CARRIERE INDUSTRIAL SUPPLY Ltd. (Toronto). "Monitoring wear assembles, systems, and methods for m... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,449, issued on April 21, was assigned to University of Manitoba (Winnipeg, Canada). "Method of calibrating optical coherence tomography ap... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,450, issued on April 21, was assigned to LEICA MICROSYSTEMS NC INC. (Durham, N.C.). "Bulk glass interferometer design with dispersion for ... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,451, issued on April 21, was assigned to National Taiwan University (Taipei, Taiwan). "Low coherence interferometer imaging system" was in... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,452, issued on April 21, was assigned to JIANGSU JITRI INTELLIGENT OPTOELECTRONIC SYSTEM RESEARCH INSTITUTE Co. LTD. (Jiangsu, China). "2D... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,453, issued on April 21, was assigned to Hefei Heshi Keda Intelligent Technology Co. Ltd. (Hefei, China). "System and method for synchrono... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,454, issued on April 21, was assigned to Heidelberger Druckmaschinen AG (Heidelberg, Germany). "Device and method for capturing the surfac... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,455, issued on April 21, was assigned to UVeye Ltd. (Tel Aviv, Israel). "Gap and flush measurement" was invented by Dan Segal (RaAnana, Is... Read More
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,607,456, issued on April 21, was assigned to 2Pi Inc. (Cambridge, Mass.). "Wide field-of-view metasurface optics, sensors, cameras and project... Read More