US Patent Issued to CANON on April 7 for "Camera system" (Japanese Inventor)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,074, issued on April 7, was assigned to CANON K.K. (Tokyo). "Camera system" was invented by Aihiko Numata (Tokyo). According to the abstra... Read More

US Patent Issued to General Electric, Oliver Crispin Robotics on April 7 for "Inspection systems and methods employing different wavelength directional light for enhanced imaging" (Indian, British Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,076, issued on April 7, was assigned to General Electric Co. (Evendale, Ohio) and Oliver Crispin Robotics Ltd. (Altrincham, Great Britain). ... Read More

US Patent Issued to Apple on April 7 for "Passive camera lens smudge detection" (California Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,077, issued on April 7, was assigned to Apple Inc. (Cupertino, Calif.). "Passive camera lens smudge detection" was invented by Xiaochun Liu... Read More

US Patent Issued to SK SILTRON on April 7 for "Apparatus for analyzing metal contamination of a wafer and a method thereof" (South Korean Inventor)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,078, issued on April 7, was assigned to SK SILTRON Co. LTD. (Gumi-si, South Korea). "Apparatus for analyzing metal contamination of a wafer... Read More

US Patent Issued to TANK-EYE IE on April 7 for "Assembly for sensory and visual inspection of a closed storage tank" (Dutch Inventor)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,079, issued on April 7, was assigned to TANK-EYE IE B.V. (Hendrik-Ido-Ambacht, Netherlands). "Assembly for sensory and visual inspection of... Read More

US Patent Issued to GM GLOBAL TECHNOLOGY OPERATIONS on April 7 for "Vision inspection systems and methods using light sources of different wavelengths" (Michigan Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,080, issued on April 7, was assigned to GM GLOBAL TECHNOLOGY OPERATIONS LLC (Detroit). "Vision inspection systems and methods using light s... Read More

US Patent Issued to ARIZONA BOARD OF REGENTS ON BEHALFOF ARIZONA STATE UNIVERSITY, California Institute of Technology on April 7 for "Compact, low-power, high image rejection sideband separation receiver" (Arizona, California Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,081, issued on April 7, was assigned to ARIZONA BOARD OF REGENTS ON BEHALFOF ARIZONA STATE UNIVERSITY (Scottsdale, Ariz.) and California Ins... Read More

US Patent Issued to BRUKER NANO on April 7 for "Proximity sensor for electron backscatter diffraction systems" (German Inventor)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,082, issued on April 7, was assigned to BRUKER NANO GMBH (Berlin). "Proximity sensor for electron backscatter diffraction systems" was inve... Read More

US Patent Issued to SHIMADZU on April 7 for "Automated analyzer" (Japanese Inventor)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,083, issued on April 7, was assigned to SHIMADZU Corp. (Kyoto, Japan). "Automated analyzer" was invented by Kohji Okada (Kyoto, Japan). Ac... Read More

US Patent Issued to Decision Tree, Veracio on April 7 for "Machine learning for high-energy interactions analysis" (Colorado Inventor)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,084, issued on April 7, was assigned to Decision Tree LLC (Greeley, Colo.) and Veracio Ltd (Salt Lake City). "Machine learning for high-ene... Read More

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