ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,053, issued on April 7, was assigned to XI'AN UNIVERSITY OF ARCHITECTURE & TECHNOLOGY (Xi'an, China). "Automatic synchronous loading system... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,054, issued on April 7, was assigned to SUZHOU MICROPORT ARGUS MEDICAL CORP (Jiangsu, China). "Measuring device for lateral optical fiber l... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,055, issued on April 7, was assigned to Honor Device Co. Ltd. (Shenzhen, China). "Apparatus and method for detecting mounting state of ligh... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,056, issued on April 7. "Integrated leak detection device for engine cylinder" was invented by Evan Kwong (Monterey Park, Calif.). Accordi... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,057, issued on April 7. "ADAS calibration system including motor vehicle centerline alignment element" was invented by Jacob Kohn (Cape Cor... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,058, issued on April 7, was assigned to TrueDyne Sensors AG (Reinach, Switzerland). "Method and device for determining a sample stream conc... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,059, issued on April 7, was assigned to Clarapath Inc. (Hawthorne, N.Y.). "Automated tissue sectioning and storage system" was invented by ... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,060, issued on April 7, was assigned to Teknologian tutkimuskeskus VTT Oy (Espoo, Finland). "Method for sampling a solid object, and a syst... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,061, issued on April 7, was assigned to Jilin University (Changchun City, China). "Method for calibrating deformation pressure of large-vol... Read More
ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,062, issued on April 7, was assigned to SILTRONIC AG (Munich). "Method for classifying unknown particles on a surface of a semi-conductor w... Read More