US Patent Issued to NIRRIN TECHNOLOGIES on June 23 for "3-D printed probes for bioprocesses" (Massachusetts Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,378, issued on June 23, was assigned to NIRRIN TECHNOLOGIES INC. (Billerica, Mass.). "3-D printed probes for bioprocesses" was invented by ... और पढ़ें

US Patent Issued to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) on June 23 for "Optical detection device, detection method and device, electronic device, and storage medium" (Chinese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,379, issued on June 23, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong). "Optical detection device, detection ... और पढ़ें

US Patent Issued to LG Energy Solution on June 23 for "Marking system and marking method for identifying defect of electrode sheet" (South Korean Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,380, issued on June 23, was assigned to LG Energy Solution Ltd. (Seoul, South Korea). "Marking system and marking method for identifying de... और पढ़ें

US Patent Issued to TIAMA on June 23 for "Optical computing methods and systems for inspecting a glass container in transmitted light" (French Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,381, issued on June 23, was assigned to TIAMA (St. Genis-Laval, France). "Optical computing methods and systems for inspecting a glass cont... और पढ़ें

US Patent Issued to Akzo Nobel Coatings International on June 23 for "Estimating biofilm biomass on objects in an aquatic environment" (Dutch, British Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,382, issued on June 23, was assigned to Akzo Nobel Coatings International B.V. (Amsterdam). "Estimating biofilm biomass on objects in an aq... और पढ़ें

US Patent Issued to SUMCO on June 23 for "Method of evaluating silicon single-crystal ingot, method of evaluating silicon epitaxial wafer, method of manufacturing silicon epitaxial wafer, and method of evaluating silicon mirror polished wafer" (Japanese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,383, issued on June 23, was assigned to SUMCO Corp. (Tokyo). "Method of evaluating silicon single-crystal ingot, method of evaluating silic... और पढ़ें

US Patent Issued to ENSCAPE on June 23 for "Inspection device for the appearance of pogo pins" (South Korean Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,384, issued on June 23, was assigned to ENSCAPE Co. LTD. (Yongin-si, South Korea). "Inspection device for the appearance of pogo pins" was ... और पढ़ें

US Patent Issued to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) on June 23 for "Inspection method and inspection apparatus for wound cell" (Chinese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,385, issued on June 23, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong). "Inspection method and inspection app... और पढ़ें

US Patent Issued to Teledyne Dalsa on June 23 for "Scanning spectral X-ray imaging using an alternating high voltage X-ray source" (Canadian, American Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,386, issued on June 23, was assigned to Teledyne Dalsa B.V. (Netherlands). "Scanning spectral X-ray imaging using an alternating high volta... और पढ़ें

US Patent Issued to NUCTECH on June 23 for "Inspection system and method" (Chinese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,388, issued on June 23, was assigned to NUCTECH COMPANY Ltd. (Beijing). "Inspection system and method" was invented by Weizhen Wang (Beijin... और पढ़ें

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