ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,171, issued on July 21, was assigned to II-VI Delaware Inc. (Wilmington, Del.). "Temperature control for coiled gain fiber in fiber amplifi... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,172, issued on July 21, was assigned to NEC Corp. (Tokyo). "Optical amplifier" was invented by Takefumi Oguma (Tokyo). According to the ab... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,173, issued on July 21, was assigned to Lumentum Operations LLC (San Jose, Calif.). "Tunable terahertz burst mode for pulsed laser" was inv... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,174, issued on July 21, was assigned to SONY GROUP Corp. (Tokyo). "Surface emitting laser and surface emitting laser array" was invented by... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,175, issued on July 21, was assigned to EPISTAR Corp. (Hsinchu, Taiwan) and BREACH Corp. (Hsinchu, Taiwan). "Semiconductor device" was inve... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,176, issued on July 21, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan). "Quantum-cascade laser module" was invented by Naota A... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,177, issued on July 21, was assigned to Lumentum Operations LLC (San Jose, Calif.). "Emitter assembly with a redistribution layer for a ver... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,178, issued on July 21, was assigned to LEONARDO ELECTRONICS US INC. (Tucson, Ariz.). "High peak power laser diode assembly" was invented b... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,179, issued on July 21, was assigned to Mitsubishi Electric Corp. (Tokyo). "Semiconductor laser device" was invented by Takeshi Yamatoya (T... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,180, issued on July 21, was assigned to Mitsubishi Electric Corp. (Tokyo). "Inspection method for semiconductor laser device and inspection... Read More