Beijing Electronics Inspection and Metrology Equipment Co., Ltd. secures contract for Procurement of 0610-2642IH010243 Purchases macro defect detection equipment for Silicon Light Project of 12-inch Semiconductor IC Wafer of YDMT 2

China, April 22 -- China based Beijing Electronics Inspection and Metrology Equipment Co., Ltd. has secured contract from Beijing Yan Dong Microelectronic Technology Co., Ltd. for Procurement of 0610-2642IH010243 Purchases macro defect detection equipment for Silicon Light Project of 12-inch Semiconductor IC Wafer of YDMT 2. The value of the contract is not disclosed.

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