Japan, Jan. 30 -- NACHI FUJIKOSHI CORP has got intellectual property rights for 'X-RAY DIFFRACTION MEASUREMENT DEVICE AND PROGRAM.' Other related details are as follows:
Application Number: JP,2022-002955
Category (FI): G01N23/2055,310,G01N23/20,G01N23/205
Stage: Grant (IP right granted following substantive examination.)
Filing Date: Jan. 12, 2022
Publication Date: July 25, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....