Japan Intellectual Property Rights: THIN FILM, IN-SITU MEASUREMENT THROUGH TRANSPARENCE CRYSTAL, AND TRANSPARENCE BASE MATERIAL IN PROCESSING CHAMBER WALL

Japan, March 26 -- APPLIED MATERIALS INC has got intellectual property rights for 'THIN FILM, IN-SITU MEASUREMENT THROUGH TRANSPARENCE CRYSTAL, AND TRANSPARENCE BASE MATERIAL IN PROCESSING CHAMBER WALL.' Other related details are as follows:

Application Number: JP,2024-110618

Category (FI): H01L21/302,101@G,H01L21/302,101@H,H10P50/20,101@G,H10P50/20,101@H

Stage: Grant (IP right granted following substantive examination.)

Filing Date: July 10, 2024

Publication Date: Nov. 6, 2024

The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100

Disclaimer: Curated by HT Syndication....