Japan, May 21 -- TEKTRONIX INC has got intellectual property rights for 'TEST MEASURING DEVICE AND CALIBRATION SIGNAL GENERATION METHOD.' Other related details are as follows:
Application Number: JP,2021-206340
Category (FI): G01R13/32@J,H04L1/00@C,H04L1/00@E,H04L25/02,301@J,H04L25/02,302@Z
Stage: Grant (IP right granted following substantive examination.)
Filing Date: Dec. 20, 2021
Publication Date: June 30, 2022
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....