Japan, Jan. 28 -- HIOKI EE CORP has got intellectual property rights for 'TEST DEVICE, AND TEST METHOD.' Other related details are as follows:
Application Number: JP,2022-026961
Category (FI): G01R27/26@L,G01R31/34@A,G01R31/72
Stage: Grant (IP right document published.)
Filing Date: Feb. 24, 2022
Publication Date: Sept. 5, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....