Japan, Nov. 7 -- TORAY ENG CO LTD has got intellectual property rights for 'METHOD FOR INSPECTING APPEARANCE OF SEMICONDUCTOR CHIP AND DEVICE FOR INSPECTING APPEARANCE OF SEMICONDUCTOR CHIP.' Other related details are as follows:
Application Number: JP,2022-043461
Category (FI): G01B11/26@H,G01B11/00@H,G01N21/956@A
Stage: Grant (IP right document published.)
Filing Date: March 18, 2022
Publication Date: Sept. 29, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....