Japan, Oct. 27 -- UTECHZONE CO LTD has got intellectual property rights for 'METHOD AND SYSTEM FOR MEASURING SEMICONDUCTOR DEVICE.' Other related details are as follows:
Application Number: JP,2025-196689
Category (FI): G01B11/14@Z,G01B11/06@Z,G01B11/02@Z
Stage: Grant (IP right granted following substantive examination.)
Filing Date: Nov. 17, 2025
Publication Date: May 28
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....