Japan, Oct. 30 -- OMRON CORP has got intellectual property rights for 'MEASURING SYSTEM, INSPECTION SYSTEM, MEASURING DEVICE, MEASURING METHOD, INSPECTION METHOD, AND PROGRAM.' Other related details are as follows:
Application Number: JP,2021-007458
Category (FI): G06T7/00,610@Z,G01B11/24@K,G06T7/00,610,G01B15/04@H,G01B11/245@H
Stage: Grant (IP right document published.)
Filing Date: Jan. 20, 2021
Publication Date: Aug. 1, 2022
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....