Japan, Jan. 28 -- HIOKI EE CORP has got intellectual property rights for 'MEASURING DEVICE AND INSPECTION DEVICE.' Other related details are as follows:
Application Number: JP,2021-065562
Category (FI): G01R19/165@M
Stage: Grant (IP right document published.)
Filing Date: April 8, 2021
Publication Date: Jan. 26, 2022
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....