Japan Intellectual Property Rights: INSPECTING METHOD FOR SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE

Japan, Jan. 20 -- MITSUBISHI ELECTRIC CORP has got intellectual property rights for 'INSPECTING METHOD FOR SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE.' Other related details are as follows:

Application Number: JP,2023-069169

Category (FI): H01L29/48@D,H01L21/66@V,H01L27/06,102@A,H01L29/06,301@G,H01L29/06,301@R,H01L29/06,301@V,H01L29/78,652@N,H01L29/48@F,H01L29/78,652@D,H01L29/78,652@F,H01L29/78,652@J,H10P74/00,101@V,H10D84/80,203@D,H10D84/80,101@A,H10D8/60@F,H10D8/60@D,H10D64/64@Z,H10D64/64@B,H10D64/64,H10D62/10,101@V,H10D62/10,101@R,H10D62/10,101@G,H10D30/66,201@A,H10D30/66,103@Z,H10D30/66,103@S,H10D30/66,103@Q,H10D30/66,103@B,H10D30/66,102@S,H10D30/66,101@T,H10D30/66,101@H,H10D30/66,101@F,H10D30/66,101@D,H10D...