Japan, Oct. 30 -- KLA CORP has got intellectual property rights for 'DEVICE FOR DETECTING DEFECTS OF INDIVIDUALIZED SEMICONDUCTOR DEVICE.' Other related details are as follows:
Application Number: JP,2024-004513
Category (FI): G01N21/956@A
Stage: Grant (IP right document published.)
Filing Date: Jan. 16, 2024
Publication Date: Feb. 28, 2024
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....