Japan, July 14 -- TOSHIBA CORP has got intellectual property rights for 'DEFECT CLASSIFICATION SUPPORT DEVICE, METHOD, AND PROGRAM.' Other related details are as follows:
Application Number: JP,2023-140427
Category (FI): G06T7/00,610@Z,G01N21/956@A
Stage: PROBLEM TO BE SOLVED: To accurately calculate the feature quantity of a defect.SOLUTION: A defect classification support device according to an embodiment is provided with an acquisition unit, a first extraction unit, a second extraction unit, and a calculation unit. The acquisition unit acquires a defect image obtained by photographing the appearance of an object with a defect. The first extraction unit extracts, from the defect image, a partial defective patch image including the defe...