Intellectual Property India Publishes Patent Application for System And Method For Multimodal Surface Defect Detection And Quantification

MUMBAI, India, Aug. 31 -- Intellectual Property India has published a patent application (202611071248 A) filed by Aionos India Private Limited on June 08, 2026, for System And Method For Multimodal Surface Defect Detection And Quantification.

Inventors include Arjun Nagulapally; and Ravi Katukam.

The application for the patent was published on August 28, 2026, under issue no. 35/2026.

Abstract: Exemplary embodiments of the present disclosure are directed towards a system and method for multimodal surface defect detection and quantification. The system receives RGB image data and three-dimensional surface data of an inspected component under controlled illumination conditions generated using light-based illumination operations. The recei...