MUMBAI, India, Nov. 2 -- Intellectual Property India has published a patent application (202641126102 A) filed by Vellore Institute Of Technology, Chennai on October 22, 2026, for System And Method For Multi-View Optical Defect Analysis.
Inventors include Ravi Prakash Dwivedi; Ritam Pandey; Sai Mithil K; Shivam Yadav; and Hemant.
The application for the patent was published on October 30, 2026, under issue no. 44/2026.
Abstract: A multi-view optical defect analysis system (100) includes an image acquisition assembly (102) having a plurality of optical imaging units (102A) to acquire image data of a material from multiple viewing directions, an optical inspection unit (104) to generate inspection information from acquired image data, and ...