Intellectual Property India Publishes Patent Application for Single Pulse Reading Method To Measure Activation Energy In Nand Flash Memory Devices

MUMBAI, India, Aug. 31 -- Intellectual Property India has published a patent application (202621082134 A) filed by Indian Institute Of Technology Bombay on July 03, 2026, for Single Pulse Reading Method To Measure Activation Energy In Nand Flash Memory Devices.

Inventors include Mondal, Sandip; and Singh, Dharmendra Kumar.

The application for the patent was published on August 28, 2026, under issue no. 35/2026.

Abstract: A method and system for extracting activation energy of a NAND flash memory device are disclosed. The method includes subjecting the NAND flash memory device to selected baking temperatures and baking times, acquiring fail bit count data using Single Pulse Reading based on a single read operation, determining a median fa...