Intellectual Property India Publishes Patent Application for Particle Measurement Device, Method, And Program

MUMBAI, India, Sept. 22 -- Intellectual Property India has published a patent application (202617086477 A) filed by Kabushiki Kaisha Toshiba on July 15, 2026, for Particle Measurement Device, Method, And Program.

Inventors include Hashimoto, Yuta; Mizuuchi, Rieko; Torii, Moriaki; Hu, Jinyang; Noda, Shuhei; Kakinuma, Kenji; and Hayami, Tokusuke.

The application for the patent was published on September 18, 2026, under issue no. 38/2026.

Abstract: Provided is a particle measuring device that can be realized at a low cost and that can measure particles with easy operation. According to an embodiment, this particle measurement device comprises: a light source that supplies illumination light for illuminating particles in a liquid; an imaging...