MUMBAI, India, Nov. 2 -- Intellectual Property India has published a patent application (202611108647 A) filed by Dr B R Ambedkar National Institute Of Technology, Jalandhar on September 10, 2026, for Multi-Sample Cryogenic Thermal Characterization System For Simultaneous Steady-State And Transient Measurements.
Inventors include Ravi Verma; Lalit Bansal; Ayushi Gupta; Narendra Kumar; Anish Sachdeva; and Richa Sharma.
The application for the patent was published on October 30, 2026, under issue no. 44/2026.
Abstract: Epoxy-filler composite adhesives are widely used in various applications such as the cryogenic and semiconductor industries. However, base epoxies have inherently low thermal conductivities that necessitate the use of filler...