MUMBAI, India, June 24 -- Intellectual Property India has published a patent application (202617065669 A) filed by Orbem Gmbh on May 25, 2026, for Method For Enabling High-Throughput Imaging Of Industrial Samples.
Inventors include Coello, Eduardo; Skinner, Jason Graham; Schtzenberger, Anna; Knowles, Benjamin Richard; Kaorri, Aldo; Gmez Damin, Pedro Agustn; Molina Romero, Miguel; and Laparidou, Maria.
The application for the patent was published on June 12, 2026, under issue no. 24/2026.
Abstract: The invention relates to a Method for automated non-invasive analysis of a predetermined feature in a multitude of industrial samples (100) of a predefined sample type, the method comprising the steps of: b) recording in a preparation MRI exper...