MUMBAI, India, July 30 -- Intellectual Property India has published a patent application (202641089038 A) filed by National Institute Of Technology-Warangal on July 21, 2026, for Integration Of Reliability Indicator For Generating A Validated Interpretive Structural Model.
Inventors include Aman Dua; Dr. Ankush Goyal; and Dr. Rishika Chhabra.
The application for the patent was published on July 24, 2026, under issue no. 30/2026.
Abstract: TITLE: INTEGRATION OF RELIABILITY INDICATOR FOR GENERATING A VALIDATED INTERPRETIVE STRUCTURAL MODEL A method for generating a validated interpretive structural model incorporating a reliability indicator has been proposed in the present invention to assess inter-observer agreement. The method receives ...