Intellectual Property India Publishes Patent Application for Doppler Effect Based Deflectometry System And Method Using Multiple Reference Sensors

MUMBAI, India, July 13 -- Intellectual Property India has published a patent application (202647082932 A) filed by Measure-Ipr Aps on July 06, 2026, for Doppler Effect Based Deflectometry System And Method Using Multiple Reference Sensors.

Inventors include Sloth Jensen, Kre; and Hi, Lasse.

The application for the patent was published on July 10, 2026, under issue no. 28/2026.

Abstract: A system and method for measuring the deflection of a surface subjected to a load. The optical system comprises a plurality of sensor heads, for the measurement of a doppler shift, each sensor head being configured to emit a laser beam towards a surface and a detector arranged to detect light reflected from that surface. A mounting beam fixes the pluralit...