Intellectual Property India Publishes Patent Application for Deep Learning-Driven Autonomous Defect Inspection Framework For Semiconductor Manufacturing Systems

MUMBAI, India, Aug. 10 -- Intellectual Property India has published a patent application (202641091291 A) filed by Dr. Bhikshagugulothu; Dr. G. Narasa Raju; Mr. Bathula Srinivas; Dr. S. Varalakshmi; Mr. S. Thimmarayan; Dr. B. Manikandan; Ch Naresh; Dr. N. Dhasarathan; Mr. Pranav Sagar Saladi; and Mr. Guttula Ramesh on July 27, 2026, for Deep Learning-Driven Autonomous Defect Inspection Framework For Semiconductor Manufacturing Systems.

Inventors include Dr. Bhikshagugulothu; Dr. G. Narasa Raju; Mr. Bathula Srinivas; Dr. S. Varalakshmi; Mr. S. Thimmarayan; Dr. B. Manikandan; Ch Naresh; Dr. N. Dhasarathan; Mr. Pranav Sagar Saladi; and Mr. Guttula Ramesh.

The application for the patent was published on July 31, 2026, under issue no. 31/2026....