Intellectual Property India Publishes Patent Application for Deep Learning-Based Industrial Visual Inspection System For Automated Defect Detection And Classification

MUMBAI, India, Oct. 5 -- Intellectual Property India has published a patent application (202641115611 A) filed by R. M. D. Engineering College on September 26, 2026, for Deep Learning-Based Industrial Visual Inspection System For Automated Defect Detection And Classification.

Inventors include Dr. A. Gnanasekar; Dr. J. Sherine Glory; Dr. A. Tamizharasi; Mr. T. Venkatesan; and Mrs. G. Manisha.

The application for the patent was published on October 02, 2026, under issue no. 40/2026.

Abstract: The present invention discloses a Deep Learning-Based Industrial Visual Inspection System for Automated Defect Detection and Classification comprising an image acquisition unit, controlled illumination unit, product positioning unit, image preprocess...