Intellectual Property India Publishes Patent Application for An Intelligent Deep Learning–based System And Method For Software Reliability, Defect, And Fault Prediction

MUMBAI, India, Nov. 2 -- Intellectual Property India has published a patent application (202631124628 A) filed by C. V. Raman Global University on October 17, 2026, for An Intelligent Deep Learning–based System And Method For Software Reliability, Defect, And Fault Prediction.

Inventors include Suneel Kumar Rath; and Dr. Madhusmita Sahu.

The application for the patent was published on October 30, 2026, under issue no. 44/2026.

Abstract: An intelligent deep learning based system and method for software reliability, defect, and fault prediction is disclosed. The system acquires software metrics such as size, complexity, coupling, cohesion, change history, defect logs, and test execution data for a plurality of software modules. A preproces...