MUMBAI, India, Sept. 22 -- Intellectual Property India has published a patent application (202621093436 A) filed by Parul University Parul Institute Of Engineering Technology; Sardhara Aarti Sureshbhai; and Dr. Vipul Vekariya on August 01, 2026, for An Artifact-Aware Hybrid Deep Learning System And Method For Digital Image Forgery Detection.
Inventors include Sardhara Aarti Sureshbhai; and Dr. Vipul Vekariya.
The application for the patent was published on September 18, 2026, under issue no. 38/2026.
Abstract: The present invention relates to an artifact-aware hybrid deep learning system and method for digital image forgery detection. The invention comprises an Image Acquisition Module for receiving digital images, an Artifact-Aware Prep...