MUMBAI, India, July 24 -- Intellectual Property India has published a patent application (202621065308 A) filed by Kedar Sanjay Gurav; Prof. Deepa Abin; Abhimanyu Balasaheb Gitte; Harsh Abhishek Gupta; Aditya Suresh Gupta; and Vishwakarma Institute Of Technology on May 23, 2026, for A System And Method For Monocular Depth Estimation For Industrial Topological Inspection.
Inventors include Kedar Sanjay Gurav; Prof. Deepa Abin; Abhimanyu Balasaheb Gitte; Harsh Abhishek Gupta; and Aditya Suresh Gupta.
The application for the patent was published on July 17, 2026, under issue no. 29/2026.
Abstract: The present invention provides a hardware-constrained monocular depth estimation system and method for industrial topological surface inspection....