MUMBAI, India, June 26 -- Intellectual Property India has published a patent application (202514118166 A) filed by Guangdong Kelongwei Automation Equipment Co. , Ltd. on November 27, 2025, for A Solar Silicon Wafer Inspection All-In-One Machine.
Inventors include Su, Jincai; and Chen, Chunfu.
The application for the patent was published on June 19, 2026, under issue no. 25/2026.
Abstract: The present invention discloses a solar silicon wafer inspection all-in-one machine, comprising a front-end conveying rail, an AOI detection mechanism and an IV detection mechanism, wherein the AOI detection mechanism is positioned between the front-end conveying rail and the IV detection mechanism; at least one segment of silicon wafer conveying rail i...