Intellectual Property India Publishes Patent Application for A Miniaturized System For Subsurface Defect Detection In Composite Materials Using Gaussian Windowed Logarithmic Frequency Modulated Thermal Wave Imaging

MUMBAI, India, July 24 -- Intellectual Property India has published a patent application (202641086517 A) filed by Ghali Venkata Subbarao; Banda Sai Sandeep; and Klef Deemed To Be University on July 15, 2026, for A Miniaturized System For Subsurface Defect Detection In Composite Materials Using Gaussian Windowed Logarithmic Frequency Modulated Thermal Wave Imaging.

Inventors include Ghali Venkata Subbarao; and Banda Sai Sandeep.

The application for the patent was published on July 17, 2026, under issue no. 29/2026.

Abstract: The present invention discloses a miniaturised system for subsurface defect detection in composite materials using Gaussian windowed logarithmic frequency modulated (LogFM) thermal wave imaging. The system integrates...