MUMBAI, India, Sept. 14 -- Intellectual Property India has published a patent application (202641105923 A) filed by Dr. Tentu Nageswara Rao on September 03, 2026, for A Gc-Fid Method For Simultaneous Determination Of Endothall And Residual Stage-1 Process- Related Impurities.
Inventors include Dr. Tentu Nageswara Rao; Dr. Y. Prashanthi; and V. Sridhar.
The application for the patent was published on September 11, 2026, under issue no. 37/2026.
Abstract: ABSTRACT A GC-FID METHOD FOR SIMULTANEOUS DETERMINATION OF ENDOTHALL AND RESIDUAL STAGE-1 PROCESS-RELATED IMPURITIES The present invention relates to the field of analytical chemistry and, more particularly, to a gas chromatography-flame ionization detection (GC-FID) method for simultaneo...